Four Point Probe Equipment

Go to the "non-frames" version.

Scroll down this column to view a wide range of sheet resistance and resistivity measurement equipment.
System Configurations

click here for more information1  Jandel Wafer Four Point Probing System
Multipositon Wafer Probe combined with RM3000 Test Unit

click here for more information2  Jandel Alternative Wafer Four Point Probing System
Multipositon Wafer Probe combined with HM21 Hand Held Meter

click here for more information3  Jandel General Purpose Four Point Probing System
Multi Height Probe combined with RM3000 Test Unit

click here for more information4  Jandel Alternative General Purpose Four Point Probing System
The Mulit Height Probe can be combined with the HM21 Hand Held Meter if the greater measurement range of the RM3000 is not required.

click here for more information5  Jandel Multi Purpose Four Point Probing System
Multi Height Microposition Probe combined with RM3000 Test Unit

click here for more information6  Jandel Universal Probe with RM3000 Test Unit
Jandel Universal Probe Specialty Four Point Probe with RM3000 Test Unit

click here for more information7  Jandel Portable Four Point Probing System
Hand Applied Probe combined with the HM21 Hand Held Meter

click here for more information8  Option of RM3000 with Hand Applied Probe
Hand Applied Probe combined with the RM3000 Test Unit

click here for more information9  Jandel Cylindrical Probe combined with the HM21 Hand Held Meter for general purpose four pont probing applications

click here for more information10  Jandel Cylindrical Probe combined with the RM3000 Test Unit for general purpose four pont probing applications

click here for more information11  Jandel Portable Four Point Probing System for measuring potscrap, silicon tops and tails, ingots.

click here for more information12  SRM Probe with HM21 Hand Held Meter

click here for more information13  SRM Probe with RM3000 Test Unit

System Accessories

click here for more information14  Jandel Probe Head Light Shrouds

click here for more information15

click here for more information16  Jandel ITO Reference Sample

click here for more information17  The Jandel Cylindrical Probe Head is the model used on all Jandel four point probing systems

click here for more information18  Cylindrical Probe brochure [257K PDF file]

click here for more information19  Application Notes regarding Jandel Four Point Probe Heads[149K PDF file]

SRM-232 Four Point Probes

click here for more information20  SRM-232 Low Cost Sheet Resistance Meters, available in 4 Ranges

click here for more information21  SRM Probe Head Information

click here for more information22  SRM Calibration Fixture Information

Ecopia Hall Effect
Measurement Systems

click here for more information23  Ecopia HMS-3000 Two Temperature Hall Measurement System
click here for more information23a HMS-3000 Video (2006)

click here for more information24  Ecopia HMS-5000 Variable Temperature Hall Measurement System
click here for more information24a HMS-5000 Video (2012)

Signatone Resistivity
Wafer Mapping System

click here for more information25  SignatoneThin Film Resistivity Wafer Mapping System for wafers up to 300mm
4 Point Probe Components

click here for more information26  RM3000 Test Unit w/PC Software
Combined current source and meter in one unit. Measure from 1 milliohm-per-square up to 5 x 108 ohms-per-square

click here for more information27  RM3000 Operating Manual with software description [700K PDF file]
PC software is included with the RM3000 Test Unit

click here for more information28  Resistor Plug for external verification of RM3000 Test Unit

click here for more information29  HM21 Hand Held Meter
Hand held four point probe souce-meter with optional probe.

click here for more information30  Software for the HM21 Meter
PC software is INCLUDED with the HM21.

click here for more information31  Resistor Plug for external verification of HM21 Hand Held Meter

click here for more information32  Multiposition Wafer Probe
Manually probe 1 to 9 pre-set locations on wafers up to 8" in diameter with 1mm repeatability.

click here for more information33  Multi-Height 4 Point Probe
Easily adjusts for probing materials of varying dimensions such as large substrates, ingots, wafers, etc..

click here for more information34  Microposition Probe
Ideal for sample up to 76mm (3") diameter requiring high probe placement accuracy.


click here for more information35  Multi Height Microposition Probe
Removeable X-Y stage to provide both sample size versatility and high tip placement accuracy


click here for more information36  Universal Probe
Versatile research unit for wafers and substrates up to 76mm (3") in diameter


click here for more information37  Hand Applied 4 Point Probe
Manually probe large flat panels, ingots, etc.
click here for more information37a  High Temperature Hand Applied 4 Point Probe
The HAP is available in two versions for use at elevated temperatures.

click here for more information38  Using the Hand Applied Probe on small samples

click here for more information39  Identifying the various parts of the Hand Applied Probe

Probe Heads For All Known Systems

click here for more information40  Listing of All Jandel Four Point Probe Heads
click here for more information41  Probes for Prometrix, KLA/Tencor, & CDE
Probe heads for KLA/Tencor-Prometrix and CDE systems. These probes look similar, but are not interchangeable.

click here for more information42  Prometrix/KLA-Tencor Probe Heads[53K PDF file]

click here for more information43  CDE (Creative Design Engineering) Probe Heads [128K PFD file]

click here for more information44  Jandel Cylindrical Probe Head

click here for more information45  Cylindrical Probe brochure [257K PDF file]

click here for more information46  Application Notes regarding Jandel Four Point Probe Heads[149K PDF file]

click here for more information47  Mounting Cylindrical Probe on alternate apparatus [91K PDF file

click here for more information48  Jandel Four Pin Probe Head

click here for more information49  Jandel Cartridge with Lead Probe Head

click here for more information50  Jandel Compact Probe Head

click here for more information51  Jandel Miniature Cartridge Probe Head

click here for more information52  Jandel Miniature Cartridge with 6-32 tapped holes Probe Head

Specialty 4 Point Probe Heads

click here for more information53  High/Low Temperature 4 Pt Probes

click here for more information54  Vacuum Chamber 4 Pt Probes

click here for more information55  Unusual FIVE Point Probes

click here for more information56  Close Needle Spacing Probes

click here for more information57  Square Array Probes

click here for more information57A  Vertical Array Probes


Four Point Probe Technical Information

click here for more information58 Short Application Note on Sheet Resistance, Ohms-Per-Square, and the Calculation of Resistivity or Thickness

click here for more information59 Basic information regarding how to make four point probe measurements using Jandel resistivity test equipment.

click here for more information60 Four Point Probe Theory - A helpful article

click here for more information61 Four Point Probe Equations - A helpful article from the University of Illinois - Urbana/Champaign

click here for more information62 Understanding volume resistivity measurements and converting between ohms-per-square (sheet resistance) and ohms-cm (volume resistivity)

click here for more information63 Sample Size Requirements and Correction Factors Some questions and answers from Jandel Engineering Ltd.

click here for more information64 Haldor Topsoe Technical Documents Regarding Correction Factors Correction Factor for various material shapes and sizes

click here for more information65 1964 National Bureau of Standards Technical Note 199, "Correction Factor Tables for Four-Point Probe Resistivity Measurements on Thin, Circular Semiconductor Samples"

click here for more information66 Finite-Size Corrections for 4-Point Probe Measurements, by J. R. Senna, Instituto Nacional de Pesquisas Espaciais (INPE), Brasil

click here for more information67 Questions and answers re: resistivity & resistance, sheet resistance, volume resistivity, surface resistivity by John Clark of Jandel Engineering

click here for more information68 Q & A regarding the use of Jandel Resistivity Measurement equipment by Pete Clark of Jandel Engineering

click here for more information69 Four-Point Probe Theory of Operation from the University of California, Berkeley, EECS web site (PDF file)

Prometrix probe tip specification chart70 A table of suggested probe tip specifications for various silicon wafer types.

table of common tip radii and spacing71 A table of common four point probe tip radii and spacings

Osmium alloy tips versus tungsten carbide tips72 Osmium alloy tips versus tungsten carbide tips

Square array versus linear array four point probe73 Square array versus linear array four point probe

Reversing input current to check the validity of a four point probe measurement74 Reversing input current to check the validity of a four point probe measurement

Determining the best choice of probe tip specifications (tip spacing, spring loads, material, radii) for a given material.75 Determining the best choice of probe tip specifications (tip spacing, spring loads, material, radii) for a given material.

How long does a four point probe head last?76 How long does a four point probe head last?

Jandel FAQ77 Jandel FAQ

Hall Effect Measurement
Technical Information

click here for more information78 Wikipedia article regarding the Hall Effect

click here for more information79 Wikipedia article regarding the Van der Pauw method

click here for more information80 NIST web page regarding the theory and implementation of the Hall Effect Measurement technique



Four-Point-Probes is a division of Bridge Technology.
To request further information or to place an order, please call Bridge Technology at 480-988-2256 or send e-mail to Larry Bridge at: sales@bridgetec.com  
Fax # is 480-452-0172
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