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We are proud to offer
the Multi Height Probe
combined with the
RM3-AR Test Unit.
For use in measuring
a wide range of materials
and sample sizes...
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Ecopia HMS-3000 Hall Effect Measurement System
Low Cost
Easy To Use
Quick Results
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The Multi Height
Microposition Probe
combined with the
RM3-AR Test Unit is
Jandel's most versatile
four point probing
system...
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Motorized magnet movement, Plot temperature vs. carrier concentration, mobility, resistivity, etc.
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The Multiposition Wafer
Probe with
the RM3-AR Test Unit
provides a system for
measuring the sheet
resistance and/or
volume resistivity of
wafers up to 200mm
(8") in diameter...
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The Hand Applied Probe
combined with the HM21
Hand Held Meter is a
portable four point probe
measurement system
which incorporates the
Jandel Cylindrical probe
head...
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Low-cost hand-held testing systems that include a meter and a four-point probe for use in measuring the sheet resistance of applied coatings such as conductive paints, EMI coatings, ITO on glass, etc.
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For Measuring Silicon
Pot Scrap, Ingots, and
Remelt HM21-SRM
Hand Held Meter with
SRM Probe Head...
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Made by combining either the RM3-AR Test Unit or the HM21 Hand Held Meter with any of the following six probe units...
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Probe heads for Prometrix, KLA/Tencor, and CDE systems. Full range of specs available including close space probes (20 mil spacing)... |
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The systems are motorized and can automatically step through 9, 25, 49, or 121 test points on wafers of size 100 mm, 125 mm, 150 mm, 200 mm, or 300mm. |
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Can be used with any
four point probe to
determine whether
a material is P or
N type...
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