Multiposition Wafer Probe with RM3000 Test Unit

Manufacturer: Jandel Engineering

System Includes: Multiposition Wafer Probe + RM3000 Four Point Probe Test Unit

The Multiposition Wafer Probe combined with the RM3000 Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8") in diameter. The RM3000 Test Unit features high accuracy, an excellent range, and many features which simplify the four point probing measurement.

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Multiposition Wafer Probe with HM21 Hand Held Meter

Manufacturer: Jandel Engineering

System Includes: Multiposition Wafer Probe with HM21 Hand Held Meter

The Multiposition Wafer Probe combined with the HM21 Hand Held Meter Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8") in diameter. It has the ability to probe 1, 5, 9, or somewhat more positions on multiple wafers with 1mm positioning repeatability from wafer to wafer.

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Multi Height Probe with RM3000 Test Unit

Manufacturer: Jandel Engineering

System Includes: Multi Height Probe and the RM3000 Test Unit

The Multi Height Probe combined with the RM3000 Test Unit is our most popular combination for use in measuring a wide range of materials and sample sizes. The Multi Height probe can be used to measure wafers or larger materials up to 10" x 10", ingots, and materials that are up to 6" inches tall. The RM3000 has a wide measurement range, and an auto-ranging feature to determine the best choice of input current.

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Multi Height Probe with HM21 Hand Held Meter

Manufacturer: Jandel Engineering

System Includes: Multi Height Probe with HM21 Hand Held Meter

The probe portion of the system, the Multi Height Probe, comprises a hard anodised aluminium base 25cm wide, 29cm deep and 0.8cm thick. A 19mm diameter stainless steel column 20cm high screwed to the base supports the probe head raising and lowering mechanism incorporating the vertical slide, operating lever shaft, and micro-switch.

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Multi Purpose Manual Four Point Probing System

Manufacturer: Jandel Engineering

System Includes: Multi Height Microposition Probe + RM3000 Four Point Probe Test Unit

The Multi Height Microposition Probe combined with the RM3000 Test Unit is Jandel's most versatile four point probing system. It includes a fine X-Y stage for positioning small samples under the four point probe tips. The X-Y stage can be easily removed for measuring large samples such as substrates up to 10" x 10", or tall materials up to 6" tall.

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Universal Probe with RM3000 Test Unit

Manufacturer: Jandel Engineering

System Includes: Universal Probe + RM3000 Four Point Probe Test Unit

The Universal Probe combined with the RM3000 Test Unit is a unique system for general pupose use as well as for certain special applicattions.

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Hand Applied Probe with HM21 Hand Held Meter

Manufacturer: Jandel Engineering

System Includes: Hand Applied Probe and the HM21 Hand Held Meter

The Hand Applied Probe combined with the HM21 Hand Held Meter is a high quality portable four point probe measurement system which incorporates the Jandel Cylindrical probe head. The system can be used to measure a wide range of materials with varying shapes and sizes.

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Hand Applied Probe with RM3000 Test Unit

Manufacturer: Jandel Engineering

System Includes: Hand Applied Probe with RM3000 Test Unit

The Hand Applied Probe combined with the RM3000 is a high quality four point probe measurement system which incor-porates the Jandel Cylindrical probe head. The system can be used to measure a wide range of materials with varying shapes and sizes.

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Jandel HM21-SRM Hand Held Meter with SRM Probe Head
for Measuring Silicon Tops and Tails, Potscrap, Ingots, and Homogeneous Silicon Wafers.

Manufacturer: Jandel Engineering

System Includes: HM21-SRM Hand Held Meter with SRM Probe Head

The HM21-SRM is a portable system that can accurately measure silicon tops and tails, potscrap, and ingots. The key to the simplicity of this application is the fact that setting the input current to 1mA produces a read-out value in millivolts that is numerically equivalent to bulk resistivity expressed in ohms-cm.

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Jandel HM21-SRM Hand Held Meter with SRM Probe Head
for General Purpose Sheet Resistance Measurments

Manufacturer: Jandel Engineering

System Includes: HM21-SRM Hand Held Meter with SRM Probe Head

The HM21-SRM can be used to measure a wide range of materials including various thin films, semiconductors, transparent oxide coatings, metal films, etc. Click below to download a PDF file regarding the use of this system for general purpose four point probing applications.

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General Purpose Four Point Probing System for Measuring Sheet Resistance or Volume Resistivity

Manufacturer: Jandel Engineering

System Includes: SRM Probe Head with RM3000 Four Point Probe Test Unit

The SRM probe is a lower cost plastic bodied probe that is suitable for use in measuring a wide range of materials including various conductive coatings, ITO on glass, silicon wafers, ingots, potscrap, conductive paints, and various thin films.

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Four-Point-Probes is a division of Bridge Technology. To request further information please call Bridge Technology at (480) 988-2256 or send e-mail to Larry Bridge at: sales@bridgetec.com