Jandel Multi Height four point probe
Bridge Technology since 1995
Four-Point-Probes

Jandel Multi Height Four-Point Probe Stand
Multi Height Probe shown probing an ingot
Multi Height Probe shown probing an 8" wafer
(click either photo to see a larger image)

See the Multi Height Probe configured with the RM3-AR Test Unit as a complete four point probe system.

Download the Multi Height Probe (38K PDF file) one page product brochure

Download the instruction manual (476K PDF file) for the Multi Height Probe
  • Allows probing of wafers, ingots, or samples of widely varying dimensions
  • Locking mechanism allows the arm to be moved up and down the steel pole and locked to suit any sample height
  • Plug attached to the arm prevents the wiring from getting entangled with samples, fingers etc
  • Smooth base for positioning samples
  • Includes one Jandel Cylindrical probe head

Application
Measurement of resistivity of samples by the four point technique. From wafers to ingots up to 10" deep by 6" high. Width is limited only by need to support the ends.

Construction
The unit comprises a hard anodised aluminium alloy plate 8mm thick with a vertical column, on which is mounted a Jandel cylindrical probe with a raising and lowering mechanism. You can slide this assembly up or down the column and clamp it in position. If desired an adjustable micro-switch enables an interlock to operate prevent sparking when the probe is lowered onto the specimen.

The connection to a measuring system is made via a 9-way socket on the raising and lowering assembly. The probe head can be changed by releasing a single clamp screw and unplugging from a 5-way socket. The probe head / lead is identical to that used on the Jandel Multiposition probe.


click image for more information
For additional versatility, the optional Multi Height Microposition Probe includes a removeable X-Y stage for precision probe tip placement.


Click here to download a document regarding the light shroud (the "Large Shroud") available for the Jandel Multi Height Microposition Probe for use in blocking light from sample up to 2" in diameter [150K PDF file]


A complete four point probing system consists of the Multi Height Probe shown above, combined with the RM3 Test Unit



Four-Point-Probes is a division of Bridge Technology. To request further information please call Bridge Technology at (480) 988-2256 or send e-mail to Larry Bridge at: sales@bridgetec.com
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