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Jandel Engineering Four Point Probe Systems
	0. Jandel Four Point Probe System Configurations Only
	1. Multiposition Wafer Probe with RM3-AR Test Unit
	2. Multiposition Wafer Probe with HM21 Hand Held Meter
	3. Multi Height Probe + RM3-AR Four Point Probe Test Unit
	4. Multi Height Probe with HM21 Hand Held Meter
	5. Multi Height Microposition Probe with RM3-AR Test Unit
	6. Universal Probe with RM3-AR Test Unit
	7. Jandel Hand Applied Probe with HM21 Hand Held Meter Portable System
	8. Hand Applied Probe with RM3-AR Test Unit
	9. CYL-HM21 Four Point Probe
	10. CYL-RM3AR Four Point Probe System
	11. SRM Probe Head with HM21-SRM Hand Held Meter for Bulk Resistivity Measurements
	12. SRM Probe Head with HM21-SRM Hand Held Meter for General Purpose Use
	13. SRM Probe Head with RM3-AR Test Unit
Jandel Engineering System Accessories
	14. Jandel Light Shrouds
	15. P/N Typing System
	16. Reference Sample
	17. Cylindrical Probe Head
SRM-232 Four Point Probes
	18. SRM-232 Four Point Probe
	19. SRM Probe Head Information (PDF file)
	20. SRM-232 Calibration Fixture Information (PDF file)
Ecopia Hall Effect Measurement Systems
	21. Ecopia HMS-3000 Hall Measurement System
	22. Ecopia HMS-5000 Variable Temperature Hall Effect Measurement System
Signatone Resistivity Wafer Mapping System
	23. Thin Film Resistivity Wafer Mapping System
Four Point Probe Individual Components, Measurement Electronics and Probe Units
	24. RM3-AR Test Unit
	25. HM21 Hand Held Meter
	26. Multiposition Wafer Probe
	27. Multi Height Probe
	28. Microposition Probe
	29. Multi Height Microposition Probe
	30. Universal Four-Point Probe
	31. Hand-Applied Four-Point Probe
	32. SRM Probe Head
Four Point Probe Heads For All Known Systems
	33. All Four Point Probe Heads
	34. Probes for Prometrix, KLA/Tencor, & CDE
	35. Cylindrical Probe Head
	36. Four Pin Probe Head
	37. Cartridge with Lead Probe Head
	38. Compact Probe Head
	39. Miniature Cartridge Probe Head
	40. Miniature Cartridge with 6-32 Tapped Holes Probe Head
	41. High / Low Temperature Four Point Probe Head
	42. Vacuum Chamber Four Point Probe Head
	43. Square Array (Hall) Four Point Probe Head
	44. Unusual FIVE Point Probes
	45. Close Needle Spacing Probes

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Displaying 8 to 14 (of 42 items)

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Hand Applied Probe with RM3-AR Test Unit

Manufacturer: Jandel Engineering

System Includes: Hand Applied Probe with RM3-AR Test Unit

The Hand Applied Probe combined with the RM3-AR is a high quality four point probe measurement system which incor-porates the Jandel Cylindrical probe head. The system can be used to measure a wide range of materials with varying shapes and sizes.

...more info

CYL-HM21 Four Point Probe

Manufacturer: Jandel Engineering

System Includes: CYL Probe with the HM-21 Hand Held Meter

General Purpose Portable Four Point Probing System for Measuring Sheet Resistance or Volume Resistivity. The Cylindrical Probe has spring loads which are user adjustable within one of three ranges.

...more info

CYL-RM3AR Four Point Probe System

Manufacturer: Jandel Engineering

System Includes: CYL Probe with RM3-AR Test Unit

The Jandel Cylindrical probe is built to a high level of mechanical accuracy. Specifications for radii, spacing, planarity, and spring load are verified by calibrated instruments including a video inspection system, an optical interferometer, and an electronic force gauge.

...more info

Jandel HM21-SRM Hand Held Meter with SRM Probe Head
for Measuring Silicon Tops and Tails, Potscrap, Ingots, and Homogeneous Silicon Wafers.

Manufacturer: Jandel Engineering

System Includes: HM21-SRM Hand Held Meter with SRM Probe Head

The HM21-SRM is a portable system that can accurately measure silicon tops and tails, potscrap, and ingots. The key to the simplicity of this application is the fact that setting the input current to 1mA produces a read-out value in millivolts that is numerically equivalent to bulk resistivity expressed in ohms-cm.

...more info

Jandel HM21-SRM Hand Held Meter with SRM Probe Head
for General Purpose Sheet Resistance Measurments

Manufacturer: Jandel Engineering

System Includes: HM21-SRM Hand Held Meter with SRM Probe Head

The HM21-SRM can be used to measure a wide range of materials including various thin films, semiconductors, transparent oxide coatings, metal films, etc. Click below to download a PDF file regarding the use of this system for general purpose four point probing applications.

...more info

General Purpose Four Point Probing System for Measuring Sheet Resistance or Volume Resistivity

Manufacturer: Jandel Engineering

System Includes: SRM Probe Head with HM21-SRM Hand Held Meter

The SRM probe is a lower cost plastic bodied probe that is suitable for use in measuring a wide range of materials including various conductive coatings, ITO on glass, silicon wafers, ingots, potscrap, conductive paints, and various thin films.

...more info

Jandel Light Shrouds

Manufacturer: Jandel Engineering

Model Numbers: SHROUD

Jandel offers three types of light shrouds for use with Jandel equpiment:

The Small Shroud which is primarily for adding stability when probing onto samples by holding the probe head by hand.
The Large Shroud which covers enough area that it can be used to give protection from light for light sensitive samples up to 2” in diameter. A light shroud has to completely cover the sample being tested for it to block the affects that light can have upon four point probe measurement of light sensitive materials.
The Black Cloth Shroud which can be draped over any Jandel probe station which does not already include an integral light shield. (see page 4 of this document). The black cloth shroud will provide effective light protection for relatively large samples.

...more info

Displaying 8 to 14 (of 42 items)	[<< Prev] 1 2 3 4 5 6 [Next >>]
Four-Point-Probes is a division of Bridge Technology. To request further information please call Bridge Technology at (480) 988-2256 or send e-mail to Larry Bridge at: sales@bridgetec.com

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