Four Point Probes |
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Jandel Four Point Probe Reference Sample |
Jandel Four Point Probe Reference Sample
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Jandel Engineering offers an indium-tin-oxide (ITO) coated glass sample that can be used as a reference sample to assess whether a four point probing system is working properly. The sample is not NIST traceable, however, Jandel checks their four point probing system for accuracy against an NIST traceable wafer prior to assigning a value to the ITO sample. The dimension of the samples are 2” square with the assigned value applying to the 1” central area of the sample. The assigned values are between 12 and 15 ohms-per-square which is printed on the sample as shown below.
The ITO is a transparent oxide. The labels are applied to the bottom of the sample which is not coated with ITO. The labels are applied from the bottom such that the printed value can be read through the sample while measuring the top side which has the ITO layer applied.
Jandel Indium Tin Oxide Reference Sample
Serial No. 74235
Verified measurement of central 25mm square region:
12.85 ohms/square ± 0.26
Test date: 18th April, 2008
Validity: 1 year
Notes:
This sample is not a traceable standard, it is a reference sample. The accuracy of the equipment used to assign the value of the reference sample was verified using a NIST traceable standard. NIST traceable standards are available from VLSI Standards.
Four-Point-Probes is a division of Bridge Technology. To request further information please call Bridge Technology at (480) 988-2256 or send e-mail to Larry Bridge at: sales@bridgetec.com |

