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Jandel General Purpose Manual Four Point Probing System
Jandel General Purpose Manual Four Point Probing System We are proud to offer the Multi Height Probe combined with the RM3000 Test Unit. For use in measuring a wide range of materials and sample sizes…
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Ecopia HMS-3000 Hall Effect Measurement System
Ecopia HMS-3000 Hall Effect Measurement System Ecopia HMS-3000 Hall Effect Measurement System. Low Cost. Easy To Use. Quick Results
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Jandel Multi Purpose Manual Four Point Probing System
Jandel Multi Purpose Manual Four Point Probing System The Multi Height Microposition Probe combined with the RM3000 Test Unit is Jandel’s most versatile four point probing system…
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Ecopia HMS-5000 Variable Temperature Hall Effect Measurement System
Ecopia HMS-5000 Variable Temperature Hall Effect Measurement System Motorized magnet movement, Plot temperature vs. carrier concentration, mobility, resistivity, etc.
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Jandel Four Point Probing System for Wafers
Jandel Four Point Probing System for Wafers The Multiposition Wafer Probe with the RM3000 Test Unit provides a system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8″) in diameter… 
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Jandel Portable Four Point Probing System

Jandel Portable Four Point Probing System

The Hand Applied Probe combined with the HM21 Hand Held Meter is a portable four point probe measurement system which incorporates the Cylindrical probe head…
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SRM-232 Sheet Resistance Meter
SRM-232 Sheet Resistance Meter Low-cost hand-held testing systems that include a meter and a four-point probe for use in measuring the sheet resistance of applied coatings such as conductive paints, EMI coatings, ITO on glass, etc.
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Portable Four Point Probing System for ingots / Bulk Materials
Portable Four Point Probing System for ingots / Bulk Materials For Measuring Silicon Pot Scrap, Ingots, and Remelt HM21-SRM Hand Held Meter with SRM Probe Head…
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Jandel Four Point Probe System Configurations
Jandel  Four Point Probe System Configurations Made by combining either the RM3000 Test Unit or the HM21 Hand Held Meter with any of the following six probe units…
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Jandel Four Point Probe Heads for All Known Systems
Jandel Four Point Probe Heads for All Known Systems Probe heads for Prometrix, KLA/Tencor, and CDE systems. Full range of specs available including close space probes (20 mil spacing)…
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Signatone Thin Film Resistivity Wafer Mapping System
Signatone Thin Film Resistivity Wafer Mapping System The systems are motorized and can automatically step through 9, 25, 49, or 121 test points on wafers of size 100 mm, 125 mm, 150 mm, 200 mm, or 300mm.
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