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Jandel Engineering Four Point Probe Systems
	0. Jandel Four Point Probe System Configurations Only
	1. Multiposition Wafer Probe with RM3-AR Test Unit
	2. Multiposition Wafer Probe with HM21 Hand Held Meter
	3. Multi Height Probe + RM3-AR Four Point Probe Test Unit
	4. Multi Height Probe with HM21 Hand Held Meter
	5. Multi Height Microposition Probe with RM3-AR Test Unit
	6. Universal Probe with RM3-AR Test Unit
	7. Jandel Hand Applied Probe with HM21 Hand Held Meter Portable System
	8. Hand Applied Probe with RM3-AR Test Unit
	9. CYL-HM21 Four Point Probe
	10. CYL-RM3AR Four Point Probe System
	11. SRM Probe Head with HM21-SRM Hand Held Meter for Bulk Resistivity Measurements
	12. SRM Probe Head with HM21-SRM Hand Held Meter for General Purpose Use
	13. SRM Probe Head with RM3-AR Test Unit
Jandel Engineering System Accessories
	14. Jandel Light Shrouds
	15. P/N Typing System
	16. Reference Sample
	17. Cylindrical Probe Head
SRM-232 Four Point Probes
	18. SRM-232 Four Point Probe
	19. SRM Probe Head Information (PDF file)
	20. SRM-232 Calibration Fixture Information (PDF file)
Ecopia Hall Effect Measurement Systems
	21. Ecopia HMS-3000 Hall Measurement System
	22. Ecopia HMS-5000 Variable Temperature Hall Effect Measurement System
Signatone Resistivity Wafer Mapping System
	23. Thin Film Resistivity Wafer Mapping System
Four Point Probe Individual Components, Measurement Electronics and Probe Units
	24. RM3-AR Test Unit
	25. HM21 Hand Held Meter
	26. Multiposition Wafer Probe
	27. Multi Height Probe
	28. Microposition Probe
	29. Multi Height Microposition Probe
	30. Universal Four-Point Probe
	31. Hand-Applied Four-Point Probe
	32. SRM Probe Head
Four Point Probe Heads For All Known Systems
	33. All Four Point Probe Heads
	34. Probes for Prometrix, KLA/Tencor, & CDE
	35. Cylindrical Probe Head
	36. Four Pin Probe Head
	37. Cartridge with Lead Probe Head
	38. Compact Probe Head
	39. Miniature Cartridge Probe Head
	40. Miniature Cartridge with 6-32 Tapped Holes Probe Head
	41. High / Low Temperature Four Point Probe Head
	42. Vacuum Chamber Four Point Probe Head
	43. Square Array (Hall) Four Point Probe Head
	44. Unusual FIVE Point Probes
	45. Close Needle Spacing Probes

Products

Displaying 1 to 7 (of 42 items)

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Multiposition Wafer Probe with RM3-AR Test Unit

Manufacturer: Jandel Engineering

System Includes: Multiposition Wafer Probe + RM3-AR Four Point Probe Test Unit

The Multiposition Wafer Probe combined with the RM3-AR Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8") in diameter. The RM3-AR Test Unit features high accuracy, an excellent range, and many features which simplify the four point probing measurement.

...more info

Multiposition Wafer Probe with HM21 Hand Held Meter

Manufacturer: Jandel Engineering

System Includes: Multiposition Wafer Probe with HM21 Hand Held Meter

The Multiposition Wafer Probe combined with the HM21 Hand Held Meter Test Unit provides a high quality, easy to use system for measuring the sheet resistance and/or volume resistivity of wafers up to 200mm (8") in diameter. It has the ability to probe 1, 5, 9, or somewhat more positions on multiple wafers with 1mm positioning repeatability from wafer to wafer.

...more info

Multi Height Probe with RM3-AR Test Unit

Manufacturer: Jandel Engineering

System Includes: Multi Height Probe and the RM3-AR Test Unit

The Multi Height Probe combined with the RM3-AR Test Unit is our most popular combination for use in measuring a wide range of materials and sample sizes. The Multi Height probe can be used to measure wafers or larger materials up to 10" x 10", ingots, and materials that are up to 6" inches tall. The RM3-AR has a wide measurement range, and an auto-ranging feature to determine the best choice of input current.

...more info

Multi Height Probe with HM21 Hand Held Meter

Manufacturer: Jandel Engineering

System Includes: Multi Height Probe with HM21 Hand Held Meter

The probe portion of the system, the Multi Height Probe, comprises a hard anodised aluminium base 25cm wide, 29cm deep and 0.8cm thick. A 19mm diameter stainless steel column 20cm high screwed to the base supports the probe head raising and lowering mechanism incorporating the vertical slide, operating lever shaft, and micro-switch.

...more info

Multi Purpose Manual Four Point Probing System

Manufacturer: Jandel Engineering

System Includes: Multi Height Microposition Probe + RM3-AR Four Point Probe Test Unit

The Multi Height Microposition Probe combined with the RM3-AR Test Unit is Jandel's most versatile four point probing system. It includes a fine X-Y stage for positioning small samples under the four point probe tips. The X-Y stage can be easily removed for measuring large samples such as substrates up to 10" x 10", or tall materials up to 6" tall.

...more info

Universal Probe with RM3-AR Test Unit

Manufacturer: Jandel Engineering

System Includes: Universal Probe + RM3-AR Four Point Probe Test Unit

The Universal Probe combined with the RM3-AR Test Unit is a unique system for general pupose use as well as for certain special applicattions.

...more info

Hand Applied Probe with HM21 Hand Held Meter

Manufacturer: Jandel Engineering

System Includes: Hand Applied Probe and the HM21 Hand Held Meter

The Hand Applied Probe combined with the HM21 Hand Held Meter is a high quality portable four point probe measurement system which incorporates the Jandel Cylindrical probe head. The system can be used to measure a wide range of materials with varying shapes and sizes.

...more info

Displaying 1 to 7 (of 42 items)	1 2 3 4 5 6 [Next >>]
Four-Point-Probes is a division of Bridge Technology. To request further information please call Bridge Technology at (480) 988-2256 or send e-mail to Larry Bridge at: sales@bridgetec.com

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